Safeway AT100100D X ray Baggage Scanner | Anires Tech Sdn Bhd

The AT100100D is a specially designed x-ray inspection system with a tunnel opening of 100 cm x 100 cm. With the dual view technology, it shows clear images of both vertical and horizontal angles. It is used widely for screening large baggage and parcels at all security sites, including airports and customs locations.

High Speed X-ray Baggage / Parcel Scanner | Fast Belt speed 2m/s | Anires Tech

The AT130100B is high speed x-ray inspection system with a tunnel opening of 130 cm x 100 cm. It is especially designed for courier companies, to screen packages at distribution centers.

Wire Bond Metrology | VIEW Micro Metrology Systems | Anires Tech

View Micro-Metrology optical measurement machines provide ultra-fast and highly accurate inspection solutions for wire bond applications. Equipped with advanced linear motor stages and Continuous Image Capture technology, View systems ensure precise measurement and analysis without sacrificing throughput. Ideal for semiconductor packaging and microelectronics manufacturing, View systems support: - Wire bond inspection and measurement - Bond pitch, loop height, and bond position analysis - Detection of bond defects and alignment issues - High-speed automated quality control for production environments With exceptional repeatability and micron-level accuracy, View helps manufacturers improve reliability, maximize yield, and maintain the highest quality standards in wire bonding processes.

VIEW Micro Metrology Measurement Speed | VMS & Elements Software Wafer MEMS Semiconductor

View Micro-Metrology optical measurement machines are known for their incredible measurement speeds. With options for linear motor stages and our Continuous Image Capture technology, View is sure to be able to take your application to the next level.

Via Metrology | View Micro Metrology Systems | Anires Tech

VIEW Micro Metrology systems are ideal for advanced semiconductor and microelectronics inspection, including: - Through Glass Via measurement and inspection - Through Silicon Via metrology and analysis With superior accuracy, rapid data acquisition, and reliable automation, View enables manufacturers to optimize process control, improve yield, and accelerate production efficiency.

VIEW Micro Metrology high speed measurement

VIEW Micro Metrology Systems on the fly measurement. No need to sacrifice accuracy with high speed!

中文讲解 Pressure film demonstration

Convenient and intuitive inspection of the distribution and uniformity of the applied pressure. Different color densities correspond to the size of the applied pressure, and the pressure value can be determined through the standard pressure density curve. Fast measurement speed, clear and intuitive image after pressure.