Visit
Official Website

VIEW MicroLine AF 1000

Previous 8 / 12 Next

Quantity
Add Quotation


Download Files

MicroLine_AF_VIEW-A4_791034.pdf (1.81 MB)
VIEW MicroLine AF Plus high performance critical dimention optical measurement systems are designed to measure wafers, masks, MEMS, and other micro-fabricated parts.

These capable desktop instruments provide precise automated optical measurement for features as small as 0.5µm on parts up to 300 x 300mm

Please leave your enquiry here, we will reply as soon as possible.
Name*  
Company Name  
Product Interested  
Quantity  
Email*  
Contact No.*  
Messages*  
   

You have 0 items in you cart. Would you like to checkout now?
0 items