Video
High-Speed Measurement on VIEW Systems
High-Speed Measurement on VIEW Systems
Smart Metrology for Advanced Semiconductor Applications
VIEW Continuous Image Capture
High-Speed, High-Accuracy Measurement for Fan-Out, Shower Head, and Probe Card Inspection
Precision has a new standard.
In the semiconductor industry, every micron matters 〞 and every second counts.
With VIEW＊s Continuous Image Capture technology, you can inspect complex, high-density components like fan-out packages, probe cards, and shower heads at full speed without sacrificing measurement accuracy.
Purpose-Built for Semiconductor Challenges
Fan-Out WLP & Redistribution Layers (RDL)
Measure ultra-fine features during motion
Handle warpage and large formats with precision stitching
Maintain sub-micron accuracy across wide fields of view
Shower Heads
Measure hundreds of micro-nozzles quickly and consistently
Perfect concentricity, pitch, and alignment analysis
Non-contact inspection eliminates risk of surface damage
Probe Cards
High-density pin array inspection with automatic alignment
Fast measurement of probe tip height, pitch, coplanarity
Reliable results, even with complex geometries
Speed Meets Accuracy
Continuous Scanning 每 No need to stop for each image
High-Speed Throughput 每 Ideal for volume production environments
✅ Sub-Micron Precision 每 Powered by VIEW＊s advanced optics and software
✅ Robust Measurement Algorithms 每 Designed for high-contrast, fine-line features
✅ Seamless Integration 每 For QA labs, cleanrooms, and production lines
Metrology That Moves as Fast as You Do
VIEW systems with Continuous Image Capture are trusted by leading fabs, OSATs, and semiconductor equipment manufacturers worldwide 〞 enabling reliable, repeatable measurements for today's most demanding microelectronic components.
Ready to Upgrade Your Semiconductor Inspection?
Experience unmatched speed and precision with VIEW.
Contact us today to schedule a live demo or learn more.
www.anirestech.com.my
sales@anirestech.com | +60124983908
VIEW Continuous Image Capture
High-Speed, High-Accuracy Measurement for Fan-Out, Shower Head, and Probe Card Inspection
Precision has a new standard.
In the semiconductor industry, every micron matters 〞 and every second counts.
With VIEW＊s Continuous Image Capture technology, you can inspect complex, high-density components like fan-out packages, probe cards, and shower heads at full speed without sacrificing measurement accuracy.
Purpose-Built for Semiconductor Challenges
Fan-Out WLP & Redistribution Layers (RDL)
Measure ultra-fine features during motion
Handle warpage and large formats with precision stitching
Maintain sub-micron accuracy across wide fields of view
Shower Heads
Measure hundreds of micro-nozzles quickly and consistently
Perfect concentricity, pitch, and alignment analysis
Non-contact inspection eliminates risk of surface damage
Probe Cards
High-density pin array inspection with automatic alignment
Fast measurement of probe tip height, pitch, coplanarity
Reliable results, even with complex geometries
Speed Meets Accuracy
Continuous Scanning 每 No need to stop for each image
High-Speed Throughput 每 Ideal for volume production environments
✅ Sub-Micron Precision 每 Powered by VIEW＊s advanced optics and software
✅ Robust Measurement Algorithms 每 Designed for high-contrast, fine-line features
✅ Seamless Integration 每 For QA labs, cleanrooms, and production lines
Metrology That Moves as Fast as You Do
VIEW systems with Continuous Image Capture are trusted by leading fabs, OSATs, and semiconductor equipment manufacturers worldwide 〞 enabling reliable, repeatable measurements for today's most demanding microelectronic components.
Ready to Upgrade Your Semiconductor Inspection?
Experience unmatched speed and precision with VIEW.
Contact us today to schedule a live demo or learn more.
www.anirestech.com.my
sales@anirestech.com | +60124983908
AuPdNiCu Coating thickness measurement Application
AuPdNiCu Coating thickness measurement application
Aczet XRF 每 Accurate Coating Thickness Measurement for AuPdNiCu Alloys
Looking to measure AuPdNiCu coating thickness with speed, accuracy, and confidence?
Aczet XRF Coating Thickness Analyzers deliver non-destructive, high-precision measurements for multi-element alloy coatings 〞 including gold-palladium-nickel-copper 〞 on connectors, PCBs, medical components, and more.
Fast & Accurate Results
Measure Multi-Layer & Multi-Element Coatings
Non-Destructive Testing
Real-Time Alloy Composition & Thickness
Ideal for Electronics, Automotive, Aerospace & Medical Industries
Whether it's a single-layer AuPdNiCu coating or a complex multi-layer system, Aczet XRF analyzers provide reliable, repeatable measurements 〞 ensuring your products meet strict quality and regulatory standards.
Key Features:
Coating thickness range: 0.01 µm to 50 µm
Elemental detection from Aluminum (Al) to Uranium (U)
Suitable for gold alloys, precious metals, and functional coatings
Integrated camera and laser for pinpoint accuracy
Optional SPC software for batch and statistical reporting
Applications:
AuPdNiCu coatings on connector pins
Surface finishes in semiconductor and PCB manufacturing
Quality control in medical device components
Precious metal verification in aerospace and defense
See the Difference with Aczet
Precision. Performance. Productivity.
Contact us today for a demo or consultation on how Aczet XRF can support your AuPdNiCu coating measurement needs.
Call: +60124983908
Email: sales@anirestech.com
Visit: www.anirestech.com.my
Looking to measure AuPdNiCu coating thickness with speed, accuracy, and confidence?
Aczet XRF Coating Thickness Analyzers deliver non-destructive, high-precision measurements for multi-element alloy coatings 〞 including gold-palladium-nickel-copper 〞 on connectors, PCBs, medical components, and more.
Fast & Accurate Results
Measure Multi-Layer & Multi-Element Coatings
Non-Destructive Testing
Real-Time Alloy Composition & Thickness
Ideal for Electronics, Automotive, Aerospace & Medical Industries
Whether it's a single-layer AuPdNiCu coating or a complex multi-layer system, Aczet XRF analyzers provide reliable, repeatable measurements 〞 ensuring your products meet strict quality and regulatory standards.
Key Features:
Coating thickness range: 0.01 µm to 50 µm
Elemental detection from Aluminum (Al) to Uranium (U)
Suitable for gold alloys, precious metals, and functional coatings
Integrated camera and laser for pinpoint accuracy
Optional SPC software for batch and statistical reporting
Applications:
AuPdNiCu coatings on connector pins
Surface finishes in semiconductor and PCB manufacturing
Quality control in medical device components
Precious metal verification in aerospace and defense
See the Difference with Aczet
Precision. Performance. Productivity.
Contact us today for a demo or consultation on how Aczet XRF can support your AuPdNiCu coating measurement needs.
Call: +60124983908
Email: sales@anirestech.com
Visit: www.anirestech.com.my
Gold check tester
Higher gold value check using XRF
Aczet Cube Compact Gold Purity Analyzer The Aczet Cube is a compact, high-precision X-ray fluorescence (XRF) spectrometer specifically designed for accurate and non-destructive analysis of gold purity and other precious metals. Engineered for use in jewelry shops, hallmarking centers, and precious metal refining units, the Cube delivers fast and reliable results within seconds, enabling professionals to verify gold content from 9K to 24K with exceptional ease. Key features include: Benchtop design with a small footprint ideal for retail or limited-space environments Non-destructive testing (NDT) ensures the integrity of the sample High-resolution Silicon Drift Detector (SDD) delivers fast and accurate results User-friendly touchscreen interface simplifies operation and data analysis Multi-element detection identifies and quantifies elements like Au, Ag, Pt, Pd, Rh, and others Built-in printer and storage allows for immediate documentation and record-keeping The Aczet Cube is perfect for jewelers, appraisers, and quality control professionals seeking a dependable and professional-grade solution for gold and precious metal verification.