Smart Metrology for Advanced Semiconductor Applications VIEW Continuous Image Capture High-Speed, High-Accuracy Measurement for Fan-Out, Shower Head, and Probe Card Inspection Precision has a new standard. In the semiconductor industry, every micron matters — and every second counts. With VIEW’s Continuous Image Capture technology, you can inspect complex, high-density components like fan-out packages, probe cards, and shower heads at full speed without sacrificing measurement accuracy. Purpose-Built for Semiconductor Challenges Fan-Out WLP & Redistribution Layers (RDL) Measure ultra-fine features during motion Handle warpage and large formats with precision stitching Maintain sub-micron accuracy across wide fields of view Shower Heads Measure hundreds of micro-nozzles quickly and consistently Perfect concentricity, pitch, and alignment analysis Non-contact inspection eliminates risk of surface damage Probe Cards High-density pin array inspection with automatic alignment Fast measurement of probe tip height, pitch, coplanarity Reliable results, even with complex geometries Speed Meets Accuracy Continuous Scanning – No need to stop for each image High-Speed Throughput – Ideal for volume production environments ✅ Sub-Micron Precision – Powered by VIEW’s advanced optics and software ✅ Robust Measurement Algorithms – Designed for high-contrast, fine-line features ✅ Seamless Integration – For QA labs, cleanrooms, and production lines Metrology That Moves as Fast as You Do VIEW systems with Continuous Image Capture are trusted by leading fabs, OSATs, and semiconductor equipment manufacturers worldwide — enabling reliable, repeatable measurements for today's most demanding microelectronic components. Ready to Upgrade Your Semiconductor Inspection? Experience unmatched speed and precision with VIEW. Contact us today to schedule a live demo or learn more. www.anirestech.com.my sales@anirestech.com | +60124983908

VIEW systems excel at integration into high-throughput production lines requiring fast measurement. In many cases, 100% inspection is attainable. With two highly versatile metrology software packages, VIEW systems can be programmed with highly customized edge detection and area processing functions that are perfectly suited for automated metrology, feature analysis, and defect detection. Unique tools such as Area Multi-Focus and Continuous Image Capture (strobing) along with powerful parametric and CAD-driven programming tools provide tremendous flexibility to enhance productivity.

VIEW Micro Metrology System Introduction Contact: sales@anirestech.com

VMS Measurement Basics High Accuracy and speed!

VIEW Micro-Metrology provides high speed, high precision non-contact measuring systems for manufacturing process control. VIEW's high performance measuring systems and software are ideally suited for the small feature sizes and complex dimensioning schemes typical of micro-electronic and micro-fabricated parts.